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An effective and efficient defect inspection system for TFT-LCD polarized films using adaptive thresholds and shape-based image analyses

C.H.Noh, S.L.Lee, D.H,Kim, C.W.Chung, S.H.Kim, "An effective and efficient defect inspection system for TFT-LCD polarized films using adaptive thresholds and shape-based image analyses," to appear in International Journal of Production Research.




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